CATBeamTech以碳纳米管X射线技术挑战半导体市场,瞄准HBM缺陷检测
CATBeamTech已将业务从医疗X射线解决方案扩展至半导体行业。其核心技术利用碳纳米管(CNT)X射线识别HBM等器件的内部缺陷。原文未披露具体时间、地点、客户名称及产量或金额数字。该技术面向半导体制造中的缺陷检测环节,与HBM等存储器件供应链的良率与检测相关。
原文深度解读
本文是对CATBeamTech首席执行官Je-hwang Ryu的采访,主题是该公司将其基于碳纳米管(CNT)的X射线技术从医疗领域扩展至半导体行业,重点针对HBM(高带宽内存)内部缺陷检测。文章涉及CATBeamTech、SEC、Zeiss、Nvidia等主体,提及HBM堆叠层数(4、8、12、16层)、缺陷检测范围(10-100纳米)、竞争对手典型规格(约500纳米)、单点检测时间(10-60分钟)、设备价格(5亿至30亿韩元)、政府资助(约10亿韩元)以及Nvidia B200采购量(25万台)等关键数字。与电子元器件供应链的关系在于:该技术面向HBM制造中的缺陷检测与良率管理环节,可能影响HBM供应链的良率、检测效率和成本结构。
- CATBeamTech正在与国内外存储制造商进行CNT X射线设备的PoC评估,客户提供正常与缺陷样本混合批次,通过比对分类结果与客户答案来评估设备性能。
- HBM采用4、8、12或16层DRAM芯片垂直堆叠结构,CATBeamTech可识别微凸块连接失效、芯片翘起和翘曲等缺陷;随着堆叠层数增加,早期检测变得关键,因为堆叠完成后才发现缺陷会导致前序所有制造步骤的损失累积。
- CATBeamTech的设备可检测10至100纳米的缺陷,而据CEO称竞争对手通常在500纳米级别观察,精度优势为5至50倍;但更小缺陷检测存在权衡,如检测时间更长,商业化产品正开发针对100纳米级缺陷检测的优化技术以平衡速度与分辨率。
- CATBeamTech采用CNT作为电子发射体,相比传统灯丝源,CNT通过电场发射电子无需加热,具有更快的检测速度、更易小型化、可精确控制输出(根据目标材料厚度和密度调整X射线功率)等优势。
- CATBeamTech被韩国中小企业和初创企业部(MSS)选为“Deep-Tech Startup 1000+”项目下的有前景的半导体初创企业,获得约10亿韩元资助,用于商业化和研发,并得到网络连接和客户对接方面的指导。
- 单台设备价格根据检测速度和物流整合程度,一般在5亿至30亿韩元之间;检测单个点通常需要10至60分钟,HBM横截面样本约10mm×10mm;客户无条件希望达到100分,但实际得分在50至95分之间波动,取决于是否指定检测点等因素。
供应链影响
- 若CATBeamTech的CNT X射线检测技术被HBM制造商采用,可能提升HBM制造过程中的早期缺陷发现能力,从而可能减少因堆叠完成后才发现缺陷而导致的整颗芯片报废损失,但实际效果取决于客户产线整合与检测速度的平衡。
- 该技术针对10-100纳米级缺陷的检测能力,可能使HBM供应链在良率管理方面获得更精细的数据支持,但受限于当前PoC阶段和抽样检测模式,短期内可能难以实现100%全检,对整体良率提升的贡献取决于后续商业化进展。
- CATBeamTech的设备价格区间(5亿至30亿韩元)和检测时间(单点10-60分钟)可能影响HBM制造商在检测环节的资本支出和产能规划,若检测速度无法满足量产节拍,可能仍主要限于研发和抽样检测场景。
- 韩国政府通过MSS对CATBeamTech的资助和客户对接支持,可能加速该技术与韩国本土半导体制造商(如存储厂商)的合作,从而可能影响HBM检测设备供应链的区域竞争格局,但具体影响取决于客户验证结果和采用意愿。
- 文章提及HBM良率可能低于50%的行业传闻,若该检测技术能有效量化缺陷并辅助良率管理,可能间接影响HBM的供应稳定性和成本结构,但实际影响取决于技术被采纳的广度和制造商的工艺改进程度。
系统解读,仅作为判断线索,不构成备货、出货、涨价或投资建议。
CATBeamTech首席执行官Je-hwang Ryu。(照片:THE ELEC)
CATBeamTech已将其业务从医疗X射线解决方案扩展至半导体行业。其核心技术利用基于碳纳米管(CNT)的X射线来识别高带宽内存(HBM)的内部缺陷。
CATBeamTech目前正在与国内外存储制造商就其CNT X射线设备进行概念验证(PoC)评估。在从存储制造商处收到HBM样品晶圆后,CATBeamTech对横截面进行成像,以检查特定位置的缺陷。在性能验证期间,潜在客户提供正常和缺陷样本的混合批次,通过将设备的分类结果与客户的答案进行比对来评估设备性能。
HBM具有4、8、12或16层DRAM芯片垂直堆叠的结构。CATBeamTech可识别连接各个DRAM裸片的微凸块失效、芯片翘起和翘曲等缺陷。
随着堆叠层数的增加,早期检测变得至关重要。在完成堆叠过程后才发现缺陷会导致财务损失,且这些损失会在所有前序制造步骤中累积。通过在制程中识别异常,CATBeamTech有助于将这些损失降至最低。
观察到的缺陷被量化:如果缺陷数量超过正常阈值,系统会标记异常以供制程管理。“业内有传闻称某些存储制造商的HBM良率低于50%,”CATBeamTech首席执行官Je-hwang Ryu表示。“通过追踪HBM内部的缺陷数量,我们可以帮助管理整体良率。”
X射线检测是一种非破坏性半导体测试方法,用于检查HBM内部缺陷。通过抽样检测,可以及早发现并处理制程错误。该系统扫描晶圆上的关键点以评估整体对准情况,并可对可疑区域触发二次高精度检测。SEC和Zeiss等公司也生产类似设备。
CATBeamTech的主要优势在于其能够构建完全定制化的设备。检测速度和可检测缺陷尺寸等参数可根据客户规格进行调整,因为该公司直接制造自己的设备、组件和CNT源。
该设备可检测10至100纳米的缺陷。据Ryu首席执行官称,竞争对手通常在500纳米级别观察缺陷,这使CATBeamTech具有5至50倍的精度优势。然而,更小的缺陷检测涉及权衡,例如更长的检测时间。对于商业化产品,CATBeamTech正在开发针对100纳米级缺陷检测优化的技术,以平衡速度和分辨率。
X射线检测的工作原理是让电子产生的X射线穿过目标物体以观察其内部结构。CATBeamTech利用碳纳米管(CNT)作为其电子发射体。传统X射线设备通过加热灯丝来发射电子,而CNT通过电场发射电子,无需热加热。与灯丝源相比,CNT具有更快的检测速度且更易于小型化。它们还能实现精确的输出控制,根据目标材料的厚度和密度改变X射线功率。
凭借其基于CNT的X射线技术,CATBeamTech被中小企业和初创企业部(MSS)选为“Deep-Tech Startup 1000+”项目下的有前景的半导体初创企业。入选公司从MSS获得资金用于商业化和研发。
问答
问:什么是Deep-Tech Startup项目?
答:它指的是中小企业和初创企业部(MSS)认为的深度技术领域,包括半导体、国防和医疗保健。我们被选为半导体领域的深度技术公司,他们为我们提供支持。这使我们能够进一步提炼和系统化各种技术。
问:政府给你们钱吗?
答:他们给我们资金,同时也充当桥梁。他们在网络连接和将我们与客户公司对接方面提供了很好的指导。
问:他们给多少钱?
答:大约10亿韩元。我们最初从医疗和组件技术起步,所以工业方面有些陌生,是我们不太了解的领域。该项目为我们快速进入这个市场提供了绝佳机会。
问:你们是因为已经拥有深度技术而被选中?还是作为创造深度技术的候选者之一被选中?
答:他们两者都看。核心技术能力至关重要,公司必须拥有材料或组件技术。此外,衍生方向和应用必须符合深度技术标准才能被选中。
问:能否简要介绍一下贵公司及其专有技术?
答:我们公司是一家材料、组件和设备公司。在材料方面,我们直接拥有碳纳米管(CNT)技术并在内部合成CNT。利用CNT,应用可以扩展到显示器、X射线,甚至粉末形式供其他材料公司使用。然而,我们最初的主要方向选择为X射线。
我们还利用从CNT尖端发射的电子制造X射线组件。我们不进口X射线源,而是拥有各种专有平台。正因为如此,就像浴室、餐厅和厨房的照明根据应用不同而不同,我们可以调整X射线源以适应特定需求——例如观察什么半导体特征、需要多高的吞吐量、或需要观察多小或多大的物体。
问:您之前出现在我们的采访频道,介绍了您的CNT源X射线技术和公司整体背景——观众可以参考我们将提供的链接。您使用自制的CNT X射线源来检查内部结构并提高电池等领域的良率。我听说您最近关注的是HBM?
答:随着AI市场急剧增长,全世界都在谈论人工智能。因此,对核心GPU中使用的HBM内部进行观察的需求显著增长。原因是低良率是这个市场众所周知的问题,这也使得内存价格极其昂贵。内存价格已大幅上涨,但展望未来,芯片将堆叠至16层。如果出现问题,整个东西都得扔掉。
如果你建好第1层并检查,然后建第2层并检查,如果没有问题就继续建,这样就行得通。但如果第2层有问题,而你继续建第3、4、5层,那么整个单元都必须丢弃。这就是为什么早期检测目前如此必要。
问:您把它比作公寓,每层都有结构组件和管道连接。HBM类似:如果微凸块形成不良、开裂或空洞,电流就无法正常流动并导致故障。贵公司的解决方案可以非破坏性地观察这一点,对吗?
答:正确。正确的堆叠意味着微凸块处于正确位置。如果你使用CT观察凸块的横截面,你可以数出它们。如果它们错位,你在那个横截面视图中就无法正常数出凸块。因此,如果这种检测进展顺利,能够在2、3、4直到8层中正常计数,该单元就被确认为良好。简而言之,将图像中测量的数值处理成统计数据——这就是我们公司正在采取的方向。
问:为什么要进行统计处理?仅仅看是否有缺陷不够吗?
答:是的,看是否有问题是称为检测的领域。但在我们的领域,即计量学,数字是关键。这些数字最终转化为直接与良率管理相关的数据。通常,一个单独的团队处理相关任务,并在设备制造过程中通过汇编统计数据来管理良率。
问:所以检测是“看”,计量是“数”?
答:是的,完全正确。因为它将问题发生的确切位置和方式表达为数字,从而允许主动预防。这种差异就是我们追求计量学的原因。
问:贵公司是一家使用视觉检测进行计数技术的公司。我好奇的一件事是:使用X射线观察HBM内部难道不是已经广泛使用的技术吗?像SEC和Zeiss这样的公司已经在这个市场了。既然大家都使用X射线,我想知道你们的差异化是什么。是更高的分辨率,还是其他差异?
答:获取X射线图像、构建3D体积数据(CT数据)并提供这些结果是相同的。我们的优势在于直接拥有X射线源技术本身。可以比作螺丝刀:你需要使用完全正确的工具来快速识别问题。这意味着我们的关键优势是提供完全匹配客户定制需求的解决方案。
最近,我们还利用人工智能(AI)技术来满足客户标准——更快地拍摄图像、降低成本、提高可见性,并增强我们的整体定制能力。像Zeiss这样的公司大多专注于通用设备。然而,我们位于韩国的优势使我们能够与这里的客户紧密合作。
问:您提到拥有CNT源技术允许您以客户想要的任何形式构建设备。可能存在哪些具体的客户需求?
答:即使在观察HBM内部时,需求也不同。在某些情况下,他们只需要看微凸块,而在其他情况下,他们需要检查芯片翘起或翘曲。根据情况,他们可能需要使用单个X射线源、五个源,或者极端情况下约50个源。准确理解客户需求并设计匹配的系统结构以提供解决方案,是我们与现有公司的主要区别。
问:速度和维护方面呢?关于寿命,CNT相比灯丝不是更短吗?
答:技术已经显著进步,所以寿命现在处于相似水平。从技术上讲,灯丝使用加热方法,而碳纳米管可以视为数字X射线源。灯丝是模拟技术,而CNT是数字技术。灯丝是灯泡技术,而CNT是LED技术。灯泡设置只使用单个源,因为像数字设备那样开关很困难,所以它保持持续点亮。相比之下,CNT技术可以非常容易地开关。
因此,如果根据检测目标需要多个源,它们可以部署为阵列。如果某个区域厚或密,我们可以使用更强的X射线;如果密度低,我们可以使用更低输出的X射线。提供定制配置是CNT的巨大优势。
问:例如,在医院做CT扫描时,机器旋转并需要时间。您是说不是旋转源,而是将源排列成圆形阵列以一次性捕获图像?
答:完全正确。医院CT扫描仪中使用的X射线源是灯丝,意味着内部只有一个X射线源。因为它产生热量,所以需要冷却系统。然后,需要称为发生器的大型电源模块。
它还需要高级轴承,当所有用于保持稳定性的机械组件加起来时,重量达数吨。当该技术过渡到数字时,工业应用获得完全相同的好处。我们公司的起点原本是改变医疗领域的范式,现在我们能够在工业领域实现同样的优势。
问:贵公司的设备真的能识别低至10纳米级的缺陷吗?
答:我们是一家拥有旨在达到10纳米领域的技术解决方案的公司。竞争对手的典型规格约为500纳米,即0.5微米。我们拥有前面提到的核心X射线技术和焦点控制技术。需要光学技术,通过协调布局、放大倍率和振动控制,我们可以观察到低至10纳米。
问:你们现在能看到低至10纳米吗?
答:是的,尽管10纳米并非以水晶般清晰的精度可见;它大约在10到100纳米之间。由于其他公司通常在0.5微米左右,我们可以看得好得多。有一个最大化分辨率的高端设备市场,但量产线上使用的设备有尺寸限制。在这些生产约束下,10纳米显然无法看到。
问:检测单个HBM需要多长时间?
答:这取决于它是4层还是8层堆叠,但检测单个点通常需要约10到60分钟。
问:“单个点”是什么意思?
答:HBM横截面样本大约10mm×10mm大小,我们观察该样本上的一个特定点。
问:那么客户不能将其用于100%全检;他们会用于抽样测试?
答:正确。如果是300mm晶圆,它有四个象限。他们可以逐个或两个两个地检测,以获得代表整体对准状态的信息。
问:所以它主要用于开发过程?
答:对。有些团队在开发期间看,有些在最终阶段看。我相信必须在开发期间使用才能有效捕捉良率。
问:您是说他们先粗略看,如果似乎有问题,就把它拿过来对那个确切位置进行精确成像?
答:完全正确。第1步是筛选检测,第2步是精确检测。在筛选中,他们可能使用快速CT扫描或仅用基本X射线观察。
问:如果在X射线下出现可疑区域,你们会对该区域进行统计处理吗?
答:我们只检测可疑区域。我们检测代表性点,检查一定周围区域,然后进入下一个流程。
问:市场对此需求高吗?
答:正如业内所知,当前(HBM)良率相当差。有传闻称某些公司低于50%。从资源效率角度来看并不好。
问:作为非专家来说,进行100%全检不是更有效地提升良率吗?X射线无法全检吗?
答:有可能。然而,由于当前AI热潮,即使芯片被丢弃,半导体制造商的客户也有巨大的产品需求并不断要求持续供应。这就是当前生态系统形成的原因。但展望未来10年,正常的制造过程必须包括良率管理。这样,我们优秀的国内半导体制造商才能保持对中国和后来者的差距,同时为未来做准备。我们希望用我们的核心分析和良率管理技术做出贡献。
问:所以您是说他们目前不做全检。是因为他们不能,还是选择不做?
答:两者都有。缺陷不容易看到,而且检测耗时太长。
问:但贵公司的解决方案也不是全检方法,对吗?
答:目前,我们处于PoC阶段——展示概念并建立检测逻辑。
问:潜在客户最感兴趣的点是什么?他们是被比其他人看到更精细的细节所吸引,还是你们的专有源技术和更快的检测速度?
答:客户有更接近研发实验室的团队和更接近生产工厂的团队。自然,研发团队重视精度,即使速度较慢,而工厂团队说:“可以不那么精确,只要快就行。”两种需求都存在。
加快检测会使图像稍微不清晰或模糊,而花更多时间则产生更清晰的图像。这是一个权衡。
问:你们目前在与谁洽谈?
答:我们正在与所有主要半导体客户洽谈,包括韩国和美国公司。
问:他们肯定是存储制造商。关于HBM的讨论何时开始?
答:我们去年开始。
问:单台设备多少钱?
答:这取决于检测速度和物流整合,但价格一般在5亿至30亿韩元之间。如果需要快速拍摄同时保持清晰度,是30亿韩元;如果拍摄相对较慢且分辨率较低,是5亿韩元。
问:目前正在进行PoC吗?
答:是的。
问:进行PoC涉及什么?你们是接收晶圆和芯片进行检测,还是设备安装在某个现场?
答:客户的要求就像:“我们会给你样品,展示结果给我们看。”他们首先要求可视化数据。
问:他们会告诉你们要捕获哪些特定点吗?
答:他们会问:“你能看到什么?”、“你能数出数字吗?”等。
问:结果也能用AI改进吗?
答:我们需要引导它同时提高检测精度和速度。
问:所以你们接收样品,检测,发回结果,并继续这个循环?
答:是的,我们持续交换数据。检测从市售GPU中提取的HBM可以自由推广。我们今天展示的是从我们购买的Nvidia板拆解下来的样品,因为客户样品不能披露。客户在已经知道正确答案的情况下向我们提问。
问:意思是如果是缺陷样品,缺陷应该显示出来?
答:他们把正常样品和缺陷样品混合在一起交给我们。
问:听起来像解谜。他们评估你们是否能看出来?
答:是的,所以他们已经知道答案。
问:他们会告诉你们答对了多少点吗?
答:是的,他们与我们分享评估结果。
问:你们现在能得100分吗?
答:有时我们得50分,有时得95分左右。
问:为什么分数会变化?是因为点捕获错误吗?
答:有时他们指定点,有时不指定。在10纳米尺度检测时,有无数个点,所以我们在100微米视场内扫描约20微米的区域,分辨率能够分辨10纳米特征。
如果有空洞,我们快速捕捉那个空白空间,或者如果对准不好,我们寻找凸块计数失败的区域。有各种参数和元素要看,所以我们根据客户需求定制解决方案。
问:什么分数能让客户满意?
答:客户无条件想要100分。
问:这意味着即使95分他们也不满意?为什么分数会是70或90分?
答:这需要一个过程。你必须从50分开始到60分,再经过60分达到70分。无论我们多聪明或有多少解决方案,这个过程是关于熟悉客户需求并相互理解。所以即使我们达到50、60、70分,最终100分,当他们下次带来另一个应用时,我们可以更快地爬升分数阶梯。
我们的最终目标是100分。如果达到100分导致无法满足速度要求,我们可能会在90分范围内妥协。
问:如果是100分,它显然会被用作良好单元,但无论得分是90还是50分,缺陷单元不应该被丢弃吗?
答:它们必须被丢弃,但客户最清楚他们能允许多少余量。有空洞并不自动意味着产品完全无法工作。看看Nvidia B200,政府提到去年采购了25万台。那些每台花费约5000万韩元,销售成本(COGS)约为50%。由于一个B200中有八个HBM,将2500万
Je-hwang Ryu, CEO of CATBeamTech. (Photo: THE ELEC)
CATBeamTech has expanded its business beyond medical X-ray solutions into the semiconductor industry. Its core technology leverages Carbon Nanotube (CNT)-based X-rays to identify internal defects in High Bandwidth Memory (HBM).
CATBeamTech is currently conducting Proof of Concept (PoC) evaluations for its CNT X-ray equipment with domestic and international memory manufacturers. Upon receiving HBM sample wafers from memory makers, CATBeamTech images cross-sections to inspect for defects at specific locations. During performance verification, potential clients provide a mixed batch of normal and defective samples, and the equipment's performance is evaluated by comparing its classification results against the client's answer key.
HBM features a vertically stacked structure of DRAM chips in 4, 8, 12, or 16 layers. CATBeamTech identifies defects such as micro-bump failures connecting individual DRAM dies, die lifting, and warping.
As the number of stacked layers increases, early inspection becomes critical. Discovering a defect after completing the stacking process results in financial losses that compound across all preceding manufacturing steps. By identifying anomalies mid-process, CATBeamTech helps minimize these losses.
The observed defects are quantified: if the defect count exceeds normal thresholds, the system flags an anomaly for process management. "In the industry, there are rumors that certain memory makers' HBM yield is below 50%," said Je-hwang Ryu, CEO of CATBeamTech. "By tracking defect counts inside HBMs, we can help manage overall yield."
X-ray inspection is a non-destructive semiconductor testing method used to check for internal HBM defects. Through sampling inspection, process errors can be detected and addressed early. The system scans key points on a wafer to evaluate overall alignment and can trigger a secondary, high-precision inspection for suspicious areas. Companies like SEC and Zeiss also produce similar equipment.
CATBeamTech's primary advantage lies in its ability to build fully customized equipment. Parameters such as inspection speed and detectable defect size can be adjusted to client specifications because the company directly manufactures its own equipment, components, and CNT sources.
The equipment can detect defects ranging from 10 to 100 nanometers. According to CEO Ryu, competitors typically observe defects at the 500-nanometer level, giving CATBeamTech a precision advantage of 5 to 50 times. However, smaller defect detection involves a trade-off, such as longer inspection times. For commercialized products, CATBeamTech is developing technology optimized for 100-nanometer-level defect detection, balancing speed and resolution.
X-ray inspection works by transmitting electron-generated X-rays through the target object to observe its internal structure. CATBeamTech utilizes carbon nanotubes (CNTs) as its electron emitters. Traditional X-ray devices emit electrons by heating a filament, whereas CNTs emit electrons via an electric field without requiring thermal heating. Compared to filament sources, CNTs offer faster inspection speeds and are easier to miniaturize. They also enable precise output control, varying X-ray power based on the thickness and density of the target material.
With its CNT-based X-ray technology, CATBeamTech was selected by the Ministry of Small and Medium-sized Enterprises and Startups (MSS) as a promising semiconductor startup under the 'Deep-Tech Startup 1000+' project. Selected companies receive funding from the MSS for commercialization and R&D.
Q&A
Q: What is the Deep-Tech Startup Project?
A: It refers to sectors that the Ministry of Small and Medium-sized Enterprises and Startups (MSS) considers deep-tech, which includes semiconductors, defense, and healthcare. We were selected as a deep-tech company in the semiconductor sector, where they provide us with support. It allows us to further refine and systemize various technologies.
Q: Does the government give you money?
A: They give us funding, and they also serve as a bridge. They provide great guidance in terms of networking and connecting us with client companies.
Q: How much money do they give?
A: Around 1 billion KRW. We originally started with medical and component technology, so the industrial side was somewhat unfamiliar and was an area we didn’t know well. The project provided a great opportunity for us to enter this market rapidly.
Q: Were you selected because you already possess deep-tech technology? Or were you selected as one of the candidates to create deep-tech technology?
A: They look at both. Core technological capability is essential, and a company must possess materials or component technology. Furthermore, the derivative directions and applications must fall under deep-tech criteria to be selected.
Q: Could you please provide a brief introduction to your company and its proprietary technology?
A: Our company is a materials, components, and equipment company. For materials, we directly possess Carbon Nanotube (CNT) technology and synthesize CNTs in-house. Using CNTs, applications can extend to displays, X-rays, or even powder forms for other materials companies. However, our initial primary direction was chosen as X-rays.
We also manufacture X-ray components using electrons emitted from the tips of CNTs. Instead of importing X-ray sources, we possess various proprietary platforms. Because of this, just as bathroom, restaurant, and kitchen lightings are all different depending on their application, we can adapt our X-ray sources to fit specific needs—such as what semiconductor feature to look at, how high throughput needs to be, or how small or large of an object we need to observe.
Q: You previously appeared on our interview channel to introduce your CNT source X-ray technology and overall company background—viewers can refer to the link we’ll provide. You’ve used self-manufactured CNT X-ray sources to inspect internal structures and improve yields in sectors like batteries. I hear your recent focus is on HBM?
A: As the AI market grew dramatically, the world became covered in talks about artificial intelligence. With that, the need to look inside the HBMs used within core GPUs has grown significantly. The reason is that low yields are a widely known issue in this market, which also makes memory prices extremely expensive. Memory prices have risen considerably, but looking ahead, chips will be stacked up to 16 layers. If a problem occurs, the whole thing has to be thrown away.
If you build the 1st floor and inspect it, then build the 2nd floor and inspect it, and keep building if there are no issues, it works fine. But if there’s a problem on the 2nd floor and you keep building the 3rd, 4th, and 5th floors, that entire unit has to be discarded. That is why early inspection is currently so necessary.
Q: You compared it to an apartment, where each floor has structural components and plumbing connections. HBM is similar: if micro-bumps are poorly formed, cracked, or voided, electricity won't flow properly and causes failures. Your company's solution can observe this non-destructively, correct?
A: That is correct. Proper stacking means the micro-bumps are in their proper positions. If you look at a cross-section of the bumps using CT, you can count them. If they are misaligned, you won't be able to count the bumps normally in that cross-sectional view. Therefore, if this inspection goes well and allows normal counting across 2, 3, 4, up to 8 layers, the unit is confirmed as good. In short, processing the numerical values measured from images into statistical data—that is the direction our company is taking.
Q: Why do you process it statistically? Isn't it enough to just see if there is a defect?
A: Yes, seeing if there's a problem is the field called inspection. But in our field, metrology, numbers are key. Those numbers are ultimately converted into data linked directly to yield management. Usually, a separate team handles related tasks and manages yield by compiling statistics during device manufacturing.
Q: So inspection is "looking at it," and metrology is "counting it"?
A: Yes, exactly. Because it expresses exactly where and how a problem occurred as a number, it allows for proactive prevention. That difference is why we aim for metrology.
Q: You are a company that uses visual inspection to perform counting technology. One thing I wondered about is: isn't using X-rays to look inside HBM already a widely used technology? Companies like SEC and Zeiss are already in this market. Since everyone uses X-rays, I wondered what your differentiation is. Is it higher resolution, or are there other differences?
A: Obtaining X-ray images, building 3D volume data (CT data), and providing those results are the same. Our strength lies in directly possessing the X-ray source technology itself. It can be compared to a screwdriver: you need to use the exact right tool for the situation to identify problems quickly. This means our key advantage is providing solutions that perfectly match customer customization needs.
Recently, we have also been leveraging Artificial Intelligence (AI) technology to meet customer criteria—shooting images faster, lowering costs, improving visibility, and enhancing our overall customization capabilities. Companies like Zeiss mostly focus on general-purpose equipment. However, our advantage of being based in South Korea allows us to collaborate closely with clients here.
Q: You mentioned that holding the CNT source technology allows you to build equipment in whatever form the customer wants. What specific customer requirements might exist?
A: Even when looking inside HBM, requirements differ. In some cases, they only need to look at micro-bumps, while in others, they need to inspect die lifting or warping. Depending on the case, they might need to use a single X-ray source, five sources, or in extreme cases, around 50 sources. Accurately understanding customer needs and designing matching system structures to deliver solutions is our major point of differentiation from existing companies.
Q: How about speed and maintenance? Regarding lifespan, isn't CNT shorter compared to filaments?
A: Technology has advanced significantly, so lifespans are now at a similar level. Technically, filaments use a heating method, whereas carbon nanotubes can be viewed as digital X-ray sources. Filaments are analog technology, while CNTs are digital. Filaments are bulb technology, whereas CNTs are LED technology. A bulb setup uses only a single source because turning it on and off like digital equipment is difficult, so it stays continuously lit. In contrast, CNT technology can be turned on and off very easily.
Therefore, if multiple sources are required depending on the inspection target, they can be deployed as an array. If a certain area is thick or dense, we can use a stronger X-ray; if density is low, we can use a lower-output X-ray. Offering customized configurations is a massive advantage of CNT.
Q: For example, when getting a CT scan at a hospital, the machine rotates and takes time. Are you saying that instead of rotating the source, you can arrange sources in a circular array to capture images at once?
A: Exactly. X-ray sources used in hospital CT scanners are filaments, meaning there is only one X-ray source inside. Because it generates heat, it requires a cooling system. Then, large power modules called generators are needed.
It also requires high-grade bearings, and when all the mechanical components for maintaining stability are added up, it weighs several tons. When that technology transitions to digital, industrial applications gain the exact same benefits. Our company's starting point was originally to change the paradigm in the medical field, and we are now able to realize those same advantages in industrial fields.
Q: Is it true that your equipment can identify defects down to the 10-nanometer level?
A: We are a company holding technology solutions aimed at reaching the 10-nanometer domain. Competitors' typical specification is around 500nm, or 0.5 micrometers. We possess the core X-ray technology and focal point control technology mentioned earlier. Optical tech is required, and by harmonizing layout, magnification, and vibration control, we can observe down to 10 nanometers.
Q: Are you able to see down to 10 nanometers right now?
A: Yes, although 10 nanometers isn't visible with crystal-clear precision; it ranges between roughly 10 and 100 nanometers. Since other companies are usually around 0.5 microns, we can see much better. There is a market for high-end equipment that maximizes resolution, but equipment used in mass production lines has size limitations. Under those production constraints, 10 nanometers obviously cannot be seen.
Q: How long does it take to inspect a single HBM?
A: It depends on whether it is a 4-layer or 8-layer stack, but inspecting a single point usually takes about 10 to 60 minutes.
Q: What does "a single point" mean?
A: An HBM cross-sectional sample is about 10mm × 10mm in size, and we are looking at one specific point on that sample.
Q: Then clients cannot use this for 100% total inspection; they would use it for sample testing?
A: Correct. If it's a 300mm wafer, it has four quadrants. They can inspect them one by one or two by two to obtain information that represents the overall alignment state.
Q: So it would mainly be used during the development process?
A: Right. Some teams look at it during development, and some look at it at the final stage. I believe it must be used during development to catch yields effectively.
Q: Do you mean they take a rough look first, and if there seems to be a problem, they bring it over to take a precise image of that exact spot?
A: Exactly. The 1st step is a screening inspection, and the 2nd step is a precision inspection. In screening, they might use a fast CT scan or look only with basic X-rays.
Q: If a suspicious area appears under X-ray, do you perform statistical processing on that region?
A: We inspect only the suspicious area. We inspect the representative point, check a certain surrounding area, and then move on to the next process.
Q: Is there high market demand for this?
A: As known in the industry, current (HBM) yields are quite poor. Some companies are rumored to be below 50%. It's not great from a resource efficiency standpoint.
Q: Speaking as a non-expert, wouldn't doing 100% total inspection be more effective for boosting yield? Is total inspection not possible with X-rays?
A: It is possible. However, due to the current AI boom, even if chips are discarded, semiconductor makers' customers have enormous product demand and keep asking for continuous supply. That's why the current ecosystem was formed. But looking ahead at the next 10 years, normal manufacturing processes must include yield management. That way, our great domestic semiconductor makers can maintain their gap over China and latecomers while preparing for the future. We want to contribute with our core analysis and yield management technology.
Q: So you're saying they currently don't do total inspection. Is it because they can't, or because they choose not to?
A: Both. Defects aren't easily visible, and inspecting takes too much time.
Q: But your company's solution isn't a total inspection method either, is it?
A: Right now, we are at the PoC stage—demonstrating the concept and establishing the inspection logic.
Q: What point are prospective clients most interested in? Are they drawn to seeing finer details than others, or is it your proprietary source tech and faster inspection speed?
A: Clients have teams closer to R&D labs and teams closer to production factories. Naturally, R&D teams value precision even if speed is slower, while factory teams say, "It can be less precise, just make it fast." Both needs exist.
Speeding up the inspection makes images slightly less clear or blurry, while spending more time yields clearer images. It's a trade-off.
Q: Who are you currently talking with?
A: We are speaking with all major semiconductor clients, including Korean and US companies.
Q: They must be memory makers. When did discussions regarding HBM begin?
A: We started last year.
Q: How much does a single unit cost?
A: It depends on inspection speed and logistics integration, but prices generally range between 500 million and 3 billion KRW. If it needs to shoot fast while maintaining crisp clarity, it's 3 billion KRW; if it shoots relatively slowly with lower resolution, it's 500 million KRW.
Q: Are PoCs currently underway?
A: Yes.
Q: What does running a PoC entail? Are you receiving wafers and chips to inspect them, or is equipment installed on-site somewhere?
A: Customer requests are like: "We'll give you samples, show us what comes out." They ask for visualization data first.
Q: Do they tell you which specific points to capture?
A: They ask things like: "What can you see?", "Can you count the numbers?", etc.
Q: Can results be improved using AI as well?
A: We need to guide it toward enhancing both inspection precision and speed.
Q: So you receive samples, inspect them, send back the results, and continue that cycle?
A: Yes, we are continuously exchanging data. Inspecting HBM extracted from commercially available GPUs can be freely promoted. What we showed today is a sample from a disassembled Nvidia board we purchased, since client samples cannot be disclosed. Clients ask us questions while already knowing the correct answers.
Q: Meaning if it's a defective sample, the defect should show up?
A: They mix normal samples and defective samples together when handing them to us.
Q: It sounds like solving a puzzle. They evaluate whether you can see it or not?
A: Yes, so they already know the answer.
Q: Do they tell you how many points you got right?
A: Yes, they share the evaluation results with us.
Q: Are you getting 100 points right now?
A: Sometimes we get 50 points, and sometimes we get around 95 points.
Q: Why do the scores vary? Is it because points were captured incorrectly?
A: Sometimes they specify the points, and sometimes they don't. When inspecting at the 10-nanometer scale, there are countless points, so we scan an area of about 20 micrometers within a 100-micrometer field at a resolution capable of resolving 10-nanometer features.
If there's a void, we quickly catch that empty space, or if alignment is bad, we look for areas where bump counting fails. There are various parameters and elements to look at, so we tailor solutions to client requirements.
Q: What score satisfies the customer?
A: Customers unconditionally want 100 points.
Q: Does that mean they aren't satisfied even with 95 points? Why do scores come out at 70 or 90 points?
A: It requires a process. You have to start from 50 to get to 60, and go through 60 to reach 70. No matter how smart we are or how many solutions we have, that process is about getting familiar with customer demands and understanding each other. So even if we hit 50, 60, 70, and eventually 100 points, when they bring another application next time, we can climb the scoring ladder much faster.
Our ultimate target is 100 points. If hitting 100 points makes it impossible to meet speed requirements, we might compromise in the 90-point range.
Q: If it's 100 points, it will obviously be used as a good unit, but whether it scores 90 or 50 points, shouldn't defective units be discarded?
A: They have to be discarded, but the client knows best how much margin they can allow. Having a void doesn't automatically mean the product won't function at all. Looking at the Nvidia B200, the government mentioned acquiring 250,000 units last year. Those cost around 50 million KRW each, with cost of goods sold (COGS) at about 50%. Since eight HBMs are in a B200, dividing 25 million KRW by eight puts one HBM at roughly 3 million KRW.
Q: People don't usually calculate it quite like that, though.
A: Yes, it's a simplified calculation. If an 8-layer stack goes in, we used to buy individual DRAMs for PC memory for 50,000 KRW each. Though it's a different memory type, an 8-layer DRAM stack would technically be a lower-cost item on its own. But when packaged as an HBM unit, it comes to around 3 million KRW. Clients can simply calculate that discarding some units still leaves high profit margins.
Q: You are currently receiving chips, sending back data, and getting scored. When do you expect this to generate actual revenue?
A: I believe that even at 80 to 90 points, clients will adopt it and adjust it internally for application. Actual line deployment might differ.
Q: Are they not using it currently?
A: They do use inspection, but our equipment offers better resolution. That is where our competitive edge lies.
Q: Is it because you build customized systems tailored to their concepts?
A: Yes. They don't reveal exact details, but judging by their reactions, follow-up projects continue. That indicates a relationship we can build upon.
Q: If this leads to actual adoption, how many units could you sell?
A: Selling one unit leads to selling two, and once the client feels confident, they could purchase up to 50 units.
Q: When investors ask if things are going well, what do you tell them?
A: We tell them that we are actively exchanging data with current HBM clients.
Q: When do you tell investors revenue will materialize?
A: Working hard on HBM inspection has created derivative technologies and spin-off products, which are already generating revenue.
Q: What are those specifically?
A: Components that go into semiconductor manufacturing equipment, such as valves. Since these components also require non-destructive testing, we built and sold inspection equipment for gas nozzles and CVD equipment parts. To investors, we explain that while HBM inspection is our pinnacle goal, we have created intermediate step-by-step product milestones along the way.
Q: CEO Ryu, once you achieve clear revenue results, please visit us again to share the news.
A: Please invite me anytime. Two years ago we discussed batteries, last year we discussed carbon nanotube materials, and now we aim to become a company specialized in HBM inspection.
I’d like to leave one final thought: the battery and display markets have largely shifted toward China, where competition is intensifying. In contrast, South Korea holds a dominant position in the HBM market. To protect this leadership, yield inspection technology is vital. Proper yield inspection will allow Korean semiconductor makers to maintain their gap over Chinese competitors for a long time. We want to contribute to that effort with our core analysis and yield management technologies.